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Items: 15

1.

Enhancement of Electrical Characteristics and Stability of Amorphous Si-Sn-O Thin Film Transistors with SiOx Passivation Layer.

Liu X, Wu W, Chen W, Ning H, Zhang X, Yuan W, Xiong M, Wang X, Yao R, Peng J.

Materials (Basel). 2018 Aug 15;11(8). pii: E1440. doi: 10.3390/ma11081440.

2.

Critical Impact of Solvent Evaporation on the Resolution of Inkjet Printed Nanoparticles Film.

Tao R, Fang Z, Zhang J, Ning H, Chen J, Yang C, Zhou Y, Yao R, Lin W, Peng J.

ACS Appl Mater Interfaces. 2018 Jul 11;10(27):22883-22888. doi: 10.1021/acsami.8b06519. Epub 2018 Jun 26.

PMID:
29939008
3.

Morphology Modulation of Direct Inkjet Printing by Incorporating Polymers and Surfactants into a Sol-Gel Ink System.

Zhu Z, Ning H, Cai W, Wei J, Zhou S, Yao R, Lu X, Zhang J, Zhou Z, Peng J.

Langmuir. 2018 Jun 5;34(22):6413-6419. doi: 10.1021/acs.langmuir.8b00745. Epub 2018 May 24.

PMID:
29750535
4.

Effect of Source/Drain Electrodes on the Electrical Properties of Silicon⁻Tin Oxide Thin-Film Transistors.

Liu X, Ning H, Chen W, Fang Z, Yao R, Wang X, Deng Y, Yuan W, Wu W, Peng J.

Nanomaterials (Basel). 2018 May 2;8(5). pii: E293. doi: 10.3390/nano8050293.

5.

Mobility Enhancement in Amorphous In-Ga-Zn-O Thin-Film Transistor by Induced Metallic in Nanoparticles and Cu Electrodes.

Hu S, Ning H, Lu K, Fang Z, Li Y, Yao R, Xu M, Wang L, Peng J, Lu X.

Nanomaterials (Basel). 2018 Mar 27;8(4). pii: E197. doi: 10.3390/nano8040197.

6.

Induced nano-scale self-formed metal-oxide interlayer in amorphous silicon tin oxide thin film transistors.

Liu X, Xu H, Ning H, Lu K, Zhang H, Zhang X, Yao R, Fang Z, Lu X, Peng J.

Sci Rep. 2018 Mar 7;8(1):4160. doi: 10.1038/s41598-018-22602-4.

7.

Properties-Adjustable Alumina-Zirconia Nanolaminate Dielectric Fabricated by Spin-Coating.

Peng J, Wei J, Zhu Z, Ning H, Cai W, Lu K, Yao R, Tao H, Zheng Y, Lu X.

Nanomaterials (Basel). 2017 Nov 29;7(12). pii: E419. doi: 10.3390/nano7120419.

8.

UV-Cured Inkjet-Printed Silver Gate Electrode with Low Electrical Resistivity.

Ning H, Zhou Y, Fang Z, Yao R, Tao R, Chen J, Cai W, Zhu Z, Yang C, Wei J, Wang L, Peng J.

Nanoscale Res Lett. 2017 Sep 25;12(1):546. doi: 10.1186/s11671-017-2300-9.

9.

A Simple Method for High-Performance, Solution-Processed, Amorphous ZrO₂ Gate Insulator TFT with a High Concentration Precursor.

Cai W, Zhu Z, Wei J, Fang Z, Ning H, Zheng Z, Zhou S, Yao R, Peng J, Lu X.

Materials (Basel). 2017 Aug 21;10(8). pii: E972. doi: 10.3390/ma10080972.

10.

Effect of Post Treatment For Cu-Cr Source/Drain Electrodes on a-IGZO TFTs.

Hu S, Fang Z, Ning H, Tao R, Liu X, Zeng Y, Yao R, Huang F, Li Z, Xu M, Wang L, Lan L, Peng J.

Materials (Basel). 2016 Jul 27;9(8). pii: E623. doi: 10.3390/ma9080623.

11.

All-Aluminum Thin Film Transistor Fabrication at Room Temperature.

Yao R, Zheng Z, Zeng Y, Liu X, Ning H, Hu S, Tao R, Chen J, Cai W, Xu M, Wang L, Lan L, Peng J.

Materials (Basel). 2017 Feb 23;10(3). pii: E222. doi: 10.3390/ma10030222.

12.

Direct Inkjet Printing of Silver Source/Drain Electrodes on an Amorphous InGaZnO Layer for Thin-Film Transistors.

Ning H, Chen J, Fang Z, Tao R, Cai W, Yao R, Hu S, Zhu Z, Zhou Y, Yang C, Peng J.

Materials (Basel). 2017 Jan 10;10(1). pii: E51. doi: 10.3390/ma10010051.

13.

Effect of Intrinsic Stress on Structural and Optical Properties of Amorphous Si-Doped SnO₂ Thin-Film.

Ning H, Liu X, Zhang H, Fang Z, Cai W, Chen J, Yao R, Xu M, Wang L, Lan L, Peng J, Wang X, Zhang Z.

Materials (Basel). 2017 Jan 1;10(1). pii: E24. doi: 10.3390/ma10010024.

14.

Room-Temperature Fabrication of High-Performance Amorphous In-Ga-Zn-O/Al2O3 Thin-Film Transistors on Ultrasmooth and Clear Nanopaper.

Ning H, Zeng Y, Kuang Y, Zheng Z, Zhou P, Yao R, Zhang H, Bao W, Chen G, Fang Z, Peng J.

ACS Appl Mater Interfaces. 2017 Aug 23;9(33):27792-27800. doi: 10.1021/acsami.7b07525. Epub 2017 Aug 10.

PMID:
28767216
15.

Direct patterning of silver electrodes with 2.4μm channel length by piezoelectric inkjet printing.

Ning H, Tao R, Fang Z, Cai W, Chen J, Zhou Y, Zhu Z, Zheng Z, Yao R, Xu M, Wang L, Lan L, Peng J.

J Colloid Interface Sci. 2017 Feb 1;487:68-72. doi: 10.1016/j.jcis.2016.10.016. Epub 2016 Oct 11.

PMID:
27744171

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