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Items: 7

1.

Highly Crystalline C8-BTBT Thin-Film Transistors by Lateral Homo-Epitaxial Growth on Printed Templates.

Janneck R, Pilet N, Bommanaboyena SP, Watts B, Heremans P, Genoe J, Rolin C.

Adv Mater. 2017 Nov;29(44). doi: 10.1002/adma.201703864. Epub 2017 Oct 10.

PMID:
29024126
2.

Nanoparticle-Based Magnetoelectric BaTiO3-CoFe2O4 Thin Film Heterostructures for Voltage Control of Magnetism.

Erdem D, Bingham NS, Heiligtag FJ, Pilet N, Warnicke P, Vaz CA, Shi Y, Buzzi M, Rupp JL, Heyderman LJ, Niederberger M.

ACS Nano. 2016 Nov 22;10(11):9840-9851. Epub 2016 Oct 11.

PMID:
27704780
3.

A single probe for imaging photons, electrons and physical forces.

Pilet N, Lisunova Y, Lamattina F, Stevenson SE, Pigozzi G, Paruch P, Fink RH, Hug HJ, Quitmann C, Raabe J.

Nanotechnology. 2016 Jun 10;27(23):235705. doi: 10.1088/0957-4484/27/23/235705. Epub 2016 May 5.

PMID:
27146329
4.

Nanostructure characterization by a combined x-ray absorption/scanning force microscopy system.

Pilet N, Raabe J, Stevenson SE, Romer S, Bernard L, McNeill CR, Fink RH, Hug HJ, Quitmann C.

Nanotechnology. 2012 Nov 30;23(47):475708. doi: 10.1088/0957-4484/23/47/475708. Epub 2012 Nov 1.

PMID:
23117254
5.

Exploring atomic-scale lateral forces in the attractive regime: a case study on graphite (0001).

Baykara MZ, Schwendemann TC, Albers BJ, Pilet N, Mönig H, Altman EI, Schwarz UD.

Nanotechnology. 2012 Oct 12;23(40):405703. Epub 2012 Sep 20.

PMID:
22995789
6.

Data acquisition and analysis procedures for high-resolution atomic force microscopy in three dimensions.

Albers BJ, Schwendemann TC, Baykara MZ, Pilet N, Liebmann M, Altman EI, Schwarz UD.

Nanotechnology. 2009 Jul 1;20(26):264002. doi: 10.1088/0957-4484/20/26/264002. Epub 2009 Jun 10.

PMID:
19509455
7.

Three-dimensional imaging of short-range chemical forces with picometre resolution.

Albers BJ, Schwendemann TC, Baykara MZ, Pilet N, Liebmann M, Altman EI, Schwarz UD.

Nat Nanotechnol. 2009 May;4(5):307-10. doi: 10.1038/nnano.2009.57. Epub 2009 Apr 6.

PMID:
19421216

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