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Items: 9


Enhancing thermoelectric performance by Fermi level tuning and thermal conductivity degradation in (Ge1-xBix)Te crystals.

Wei PC, Cai CX, Hsing CR, Wei CM, Yu SH, Wu HJ, Chen CL, Wei DH, Nguyen DL, Chou MMC, Chen YY.

Sci Rep. 2019 Jun 13;9(1):8616. doi: 10.1038/s41598-019-45071-9.


Fracture Resistance of Monolithic Zirconia Crowns in Implant Prostheses in Patients with Bruxism.

Lan TH, Pan CY, Liu PH, Chou MMC.

Materials (Basel). 2019 May 17;12(10). pii: E1623. doi: 10.3390/ma12101623.


The Extremely Enhanced Photocurrent Response in Topological Insulator Nanosheets with High Conductance.

Huang SM, Lin LJ, Yan YJ, Yu SH, Chou MMC, Hsieh HF, Ho CJ, Chen RS.

Nanoscale Res Lett. 2018 Nov 21;13(1):371. doi: 10.1186/s11671-018-2758-0.


In situ inward epitaxial growth of bulk macroporous single crystals.

Chen C, Sun S, Chou MMC, Xie K.

Nat Commun. 2017 Dec 19;8(1):2178. doi: 10.1038/s41467-017-02197-6.


Growth and Characterization of M-Plane GaN Thin Films Grown on γ-LiAlO2 (100) Substrates.

Lin YC, Lo I, Shih HC, Chou MMC, Schaadt DM.

Scanning. 2017 Oct 18;2017:2362084. doi: 10.1155/2017/2362084. eCollection 2017.


Ultrasensitive nonlinear absorption response of large-size topological insulator and application in low-threshold bulk pulsed lasers.

Xu JL, Sun YJ, He JL, Wang Y, Zhu ZJ, You ZY, Li JF, Chou MM, Lee CK, Tu CY.

Sci Rep. 2015 Oct 7;5:14856. doi: 10.1038/srep14856.


Fracture resistance of monolithic zirconia crowns with different occlusal thicknesses in implant prostheses.

Lan TH, Liu PH, Chou MM, Lee HE.

J Prosthet Dent. 2016 Jan;115(1):76-83. doi: 10.1016/j.prosdent.2015.06.021. Epub 2015 Sep 26.


The synthesis route and the growth mechanism of aligned GaN nanobelts.

Chen C, Chou MM, Yan T, Huang H, Lu CY, Chen C.

Chem Commun (Camb). 2014 Jun 1;50(43):5695-8. doi: 10.1039/c4cc01303d. Epub 2014 Apr 23.


Acoustic velocities of shear waves in La3Ga(5.5)Ta(0.5)O14 piezoelectric crystal using singular value decomposition.

Chou MM, Malocha DC.

IEEE Trans Ultrason Ferroelectr Freq Control. 2010 Aug;57(8):1813-7. doi: 10.1109/TUFFC.2010.1619.


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