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Items: 17

1.

Reentrant Resistive Behavior and Dimensional Crossover in Disordered Superconducting TiN Films.

Postolova SV, Mironov AY, Baklanov MR, Vinokur VM, Baturina TI.

Sci Rep. 2017 May 11;7(1):1718. doi: 10.1038/s41598-017-01753-w.

2.

Impact of plasma pretreatment and pore size on the sealing of ultra-low-k dielectrics by self-assembled monolayers.

Sun Y, Krishtab M, Struyf H, Verdonck P, De Feyter S, Baklanov MR, Armini S.

Langmuir. 2014 Apr 8;30(13):3832-44. doi: 10.1021/la404165n. Epub 2014 Mar 24.

PMID:
24621316
3.

Effect of pore structure of nanometer scale porous films on the measured elastic modulus.

Vanstreels K, Wu C, Gonzalez M, Schneider D, Gidley D, Verdonck P, Baklanov MR.

Langmuir. 2013 Sep 24;29(38):12025-35. doi: 10.1021/la402383g. Epub 2013 Sep 16.

PMID:
24032751
4.

Atomic layer deposition of TiO2 on surface modified nanoporous low-k films.

Levrau E, Devloo-Casier K, Dendooven J, Ludwig KF, Verdonck P, Meersschaut J, Baklanov MR, Detavernier C.

Langmuir. 2013 Oct 1;29(39):12284-9. doi: 10.1021/la4027738. Epub 2013 Sep 17.

PMID:
24000800
5.

Pore Narrowing of Mesoporous Silica Materials.

Goethals F, Levrau E, De Canck E, Baklanov MR, Detavernier C, Van Driessche I, Van Der Voort P.

Materials (Basel). 2013 Feb 20;6(2):570-579. doi: 10.3390/ma6020570.

6.

In situ monitoring of atomic layer deposition in nanoporous thin films using ellipsometric porosimetry.

Dendooven J, Devloo-Casier K, Levrau E, Van Hove R, Sree SP, Baklanov MR, Martens JA, Detavernier C.

Langmuir. 2012 Feb 28;28(8):3852-9. doi: 10.1021/la300045z. Epub 2012 Feb 15.

PMID:
22304361
7.

A new procedure to seal the pores of mesoporous low-k films with precondensed organosilica oligomers.

Goethals F, Baklanov MR, Ciofi I, Detavernier C, Van der Voort P, Van Driessche I.

Chem Commun (Camb). 2012 Mar 14;48(22):2797-9. doi: 10.1039/c2cc18017k. Epub 2012 Jan 30.

PMID:
22286331
8.

Nanoscale noncontact subsurface investigations of mechanical and optical properties of nanoporous low-k material thin film.

Lomonosov AM, Ayouch A, Ruello P, Vaudel G, Baklanov MR, Verdonck P, Zhao L, Gusev VE.

ACS Nano. 2012 Feb 28;6(2):1410-5. doi: 10.1021/nn204210u. Epub 2012 Jan 17.

PMID:
22211667
9.

Influence of varying porogen loads and different UV cures on low-kappa film characteristics.

Farrell L, Verdonck P, Van Besien E, Ciofi I, Borrello G, Vanstreels K, Mardani S, Baklanov MR.

J Nanosci Nanotechnol. 2011 Sep;11(9):8363-7.

PMID:
22097585
10.

Pseudogap in a thin film of a conventional superconductor.

Sacépé B, Chapelier C, Baturina TI, Vinokur VM, Baklanov MR, Sanquer M.

Nat Commun. 2010;1:140. doi: 10.1038/ncomms1140.

PMID:
21266990
11.

Unusual modification of CuCl or CuBr films by He plasma exposure resulting in nanowire formation.

Dictus D, Baklanov MR, Pikulev V, De Gendt S, Vinckier C, Boullart W, Vanhaelemeersch S.

Langmuir. 2010 Feb 2;26(3):2014-20. doi: 10.1021/la902543a.

PMID:
19795849
12.

Zeolite-inspired low-k dielectrics overcoming limitations of zeolite films.

Eslava S, Urrutia J, Busawon AN, Baklanov MR, Iacopi F, Aldea S, Maex K, Martens JA, Kirschhock CE.

J Am Chem Soc. 2008 Dec 24;130(51):17528-36. doi: 10.1021/ja8066572.

PMID:
19053487
13.

Reaction of trimethylchlorosilane in spin-on Silicalite-1 zeolite film.

Eslava S, Delahaye S, Baklanov MR, Iacopi F, Kirschhock CE, Maex K, Martens JA.

Langmuir. 2008 May 6;24(9):4894-900. doi: 10.1021/la800086y. Epub 2008 Apr 5.

PMID:
18393487
14.

Superinsulator and quantum synchronization.

Vinokur VM, Baturina TI, Fistul MV, Mironov AY, Baklanov MR, Strunk C.

Nature. 2008 Apr 3;452(7187):613-5. doi: 10.1038/nature06837.

PMID:
18385735
15.

Porous low dielectric constant materials for microelectronics.

Baklanov MR, Maex K.

Philos Trans A Math Phys Eng Sci. 2006 Jan 15;364(1838):201-15. doi: 10.1098/rsta.2005.1679. Review.

PMID:
18272461
16.

Characterization of a molecular sieve coating using ellipsometric porosimetry.

Eslava S, Baklanov MR, Kirschhock CE, Iacopi F, Aldea S, Maex K, Martens JA.

Langmuir. 2007 Dec 18;23(26):12811-6. Epub 2007 Nov 22.

PMID:
18031072
17.

Ultraviolet-assisted curing of polycrystalline pure-silica zeolites: hydrophobization, functionalization, and cross-linking of grains.

Eslava S, Iacopi F, Baklanov MR, Kirschhock CE, Maex K, Martens JA.

J Am Chem Soc. 2007 Aug 1;129(30):9288-9. Epub 2007 Jul 11. No abstract available.

PMID:
17625857

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