Format
Sort by

Send to

Choose Destination

Search results

Items: 2

1.

A 45 nm Stacked CMOS Image Sensor Process Technology for Submicron Pixel.

Takahashi S, Huang YM, Sze JJ, Wu TT, Guo FS, Hsu WC, Tseng TH, Liao K, Kuo CC, Chen TH, Chiang WC, Chuang CH, Chou KY, Chung CH, Chou KY, Tseng CH, Wang CJ, Yaung DN.

Sensors (Basel). 2017 Dec 5;17(12). pii: E2816. doi: 10.3390/s17122816.

2.

Statistical Analysis of the Random Telegraph Noise in a 1.1 μm Pixel, 8.3 MP CMOS Image Sensor Using On-Chip Time Constant Extraction Method.

Chao CY, Tu H, Wu TM, Chou KY, Yeh SF, Yin C, Lee CL.

Sensors (Basel). 2017 Nov 23;17(12). pii: E2704. doi: 10.3390/s17122704.

Supplemental Content

Loading ...
Support Center