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Items: 17

1.

Single-Shot Imaging of Two-Wavelength Spatial Phase-Shifting Interferometry.

Jeon JW, Joo KN.

Sensors (Basel). 2019 Nov 21;19(23). pii: E5094. doi: 10.3390/s19235094.

2.

High-speed polarized low coherence scanning interferometry based on spatial phase shifting.

Jeon JW, Jeong HW, Jeong HB, Joo KN.

Appl Opt. 2019 Jul 10;58(20):5360-5365. doi: 10.1364/AO.58.005360.

PMID:
31504003
3.
4.

Rigorous single pulse imaging for ultrafast interferometric observation.

Kim D, Lu Y, Park J, Kim B, Yan L, Yu L, Joo KN, Kim SW.

Opt Express. 2019 Jul 8;27(14):19758-19767. doi: 10.1364/OE.27.019758.

PMID:
31503731
5.

Novel combined measurement system to characterize film structures by spectral interferometry and ellipsometry.

Yun YH, Joo KN.

Opt Express. 2018 Dec 24;26(26):34396-34411. doi: 10.1364/OE.26.034396.

PMID:
30650862
6.

High-speed combined NIR low-coherence interferometry for wafer metrology.

Park HM, Joo KN.

Appl Opt. 2017 Nov 1;56(31):8592-8597. doi: 10.1364/AO.56.008592.

PMID:
29091673
7.

SPARSE (spatially phase-retarded spectroscopic ellipsometry) for real-time film analysis.

Kim DH, Yun YH, Joo KN.

Opt Lett. 2017 Aug 15;42(16):3189-3192. doi: 10.1364/OL.42.003189.

PMID:
28809904
8.

Dual low coherence scanning interferometry for rapid large step height and thickness measurements.

Park HM, Jung HW, Joo KN.

Opt Express. 2016 Dec 12;24(25):28625-28632. doi: 10.1364/OE.24.028625.

PMID:
27958506
9.
10.

Low cost wafer metrology using a NIR low coherence interferometry.

Kim YG, Seo YB, Joo KN.

Opt Express. 2013 Jun 3;21(11):13648-55. doi: 10.1364/OE.21.013648.

PMID:
23736617
11.

Frequency stabilized three mode HeNe laser using nonlinear optical phenomena.

Ellis JD, Joo KN, Buice ES, Spronck JW.

Opt Express. 2010 Jan 18;18(2):1373-9. doi: 10.1364/OE.18.001373.

PMID:
20173964
12.

High resolution heterodyne interferometer without detectable periodic nonlinearity.

Joo KN, Ellis JD, Buice ES, Spronck JW, Schmidt RH.

Opt Express. 2010 Jan 18;18(2):1159-65. doi: 10.1364/OE.18.001159.

PMID:
20173939
13.

Balanced interferometric system for stability measurements.

Ellis JD, Joo KN, Spronck JW, Munnig Schmidt RH.

Appl Opt. 2009 Mar 20;48(9):1733-40.

PMID:
19305472
14.

Simple heterodyne laser interferometer with subnanometer periodic errors.

Joo KN, Ellis JD, Spronck JW, van Kan PJ, Munnig Schmidt RH.

Opt Lett. 2009 Feb 1;34(3):386-8.

PMID:
19183667
15.

Distance measurements by combined method based on a femtosecond pulse laser.

Joo KN, Kim Y, Kim SW.

Opt Express. 2008 Nov 24;16(24):19799-806.

PMID:
19030065
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