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Items: 3

1.

Influence of surface atomic structure demonstrated on oxygen incorporation mechanism at a model perovskite oxide.

Riva M, Kubicek M, Hao X, Franceschi G, Gerhold S, Schmid M, Hutter H, Fleig J, Franchini C, Yildiz B, Diebold U.

Nat Commun. 2018 Sep 13;9(1):3710. doi: 10.1038/s41467-018-05685-5.

2.

The Chemical Capacitance as a Fingerprint of Defect Chemistry in Mixed Conducting Oxides.

Fleig J, Schmid A, Rupp GM, Slouka C, Navickas E, Andrejs L, Hutter H, Volgger L, Nenning A.

Acta Chim Slov. 2016;63(3):509-18.

PMID:
27640378
3.

The effect of bias-temperature stress on Na+ incorporation into thin insulating films.

Krivec S, Buchmayr M, Detzel T, Froemling T, Fleig J, Hutter H.

Anal Bioanal Chem. 2011 May;400(3):649-57. doi: 10.1007/s00216-011-4686-z. Epub 2011 Feb 18. Erratum in: Anal Bioanal Chem. 2011 Jul;400(9):3179.

PMID:
21331494

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