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Items: 12

1.

Direct Measurement of Crystal Growth Velocity in Epitaxial Phase-Change Material Thin Films.

Behrens M, Lotnyk A, Gerlach JW, Ehrhardt M, Lorenz P, Rauschenbach B.

ACS Appl Mater Interfaces. 2019 Nov 6;11(44):41544-41550. doi: 10.1021/acsami.9b16111. Epub 2019 Oct 25.

PMID:
31612702
2.

Ultrafast interfacial transformation from 2D- to 3D-bonded structures in layered Ge-Sb-Te thin films and heterostructures.

Behrens M, Lotnyk A, Gerlach JW, Hilmi I, Abel T, Lorenz P, Rauschenbach B.

Nanoscale. 2018 Dec 13;10(48):22946-22953. doi: 10.1039/c8nr06567e.

PMID:
30500030
3.

Detection of small bunches of ions using image charges.

Räcke P, Spemann D, Gerlach JW, Rauschenbach B, Meijer J.

Sci Rep. 2018 Jun 28;8(1):9781. doi: 10.1038/s41598-018-28167-6.

4.

Comparative study of sculptured metallic thin films deposited by oblique angle deposition at different temperatures.

Liedtke S, Grüner C, Gerlach JW, Rauschenbach B.

Beilstein J Nanotechnol. 2018 Mar 22;9:954-962. doi: 10.3762/bjnano.9.89. eCollection 2018.

5.

Ion Beam Assisted Deposition of Thin Epitaxial GaN Films.

Rauschenbach B, Lotnyk A, Neumann L, Poppitz D, Gerlach JW.

Materials (Basel). 2017 Jun 23;10(7). pii: E690. doi: 10.3390/ma10070690.

6.

Crystallization of Ge2Sb2Te5 thin films by nano- and femtosecond single laser pulse irradiation.

Sun X, Ehrhardt M, Lotnyk A, Lorenz P, Thelander E, Gerlach JW, Smausz T, Decker U, Rauschenbach B.

Sci Rep. 2016 Jun 13;6:28246. doi: 10.1038/srep28246.

7.

An aberration-corrected STEM study of structural defects in epitaxial GaN thin films grown by ion beam assisted MBE.

Poppitz D, Lotnyk A, Gerlach JW, Lenzner J, Grundmann M, Rauschenbach B.

Micron. 2015 Jun;73:1-8. doi: 10.1016/j.micron.2015.03.006. Epub 2015 Mar 23.

PMID:
25846303
8.

Thin Film Deposition Using Energetic Ions.

Manova D, Gerlach JW, Mändl S.

Materials (Basel). 2010 Jul 29;3(8):4109-4141. doi: 10.3390/ma3084109. Review.

9.

Plasmonic activity of large-area gold nanodot arrays on arbitrary substrates.

Mäder M, Höche T, Gerlach JW, Perlt S, Dorfmüller J, Saliba M, Vogelgesang R, Kern K, Rauschenbach B.

Nano Lett. 2010 Jan;10(1):47-51. doi: 10.1021/nl903633z.

PMID:
20014821
10.

Electrospray ion beam deposition: soft-landing and fragmentation of functional molecules at solid surfaces.

Rauschenbach S, Vogelgesang R, Malinowski N, Gerlach JW, Benyoucef M, Costantini G, Deng Z, Thontasen N, Kern K.

ACS Nano. 2009 Oct 27;3(10):2901-10. doi: 10.1021/nn900022p.

PMID:
19775085
11.

Ion-beam-induced collective rotation of nanocrystals.

Zizak I, Darowski N, Klaumünzer S, Schumacher G, Gerlach JW, Assmann W.

Phys Rev Lett. 2008 Aug 8;101(6):065503. Epub 2008 Aug 7.

PMID:
18764472
12.

Static-charging mitigation and contamination avoidance by selective carbon coating of TEM samples.

Höche T, Gerlach JW, Petsch T.

Ultramicroscopy. 2006 Oct-Nov;106(11-12):981-5. Epub 2006 Jul 5.

PMID:
16870340

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