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Rapid Commun Mass Spectrom. 2019 Feb 15;33(3):323-325. doi: 10.1002/rcm.8345.

Cluster secondary ion emission of silicon: An influence of the samples' dimensional features.

Author information

1
Centre for Physics and Technological Research (CeFITec), Dept. de Física da Faculdade de Ciências e Tecnologia (FCT), Universidade Nova de Lisboa, 2829-516, Caparica, Portugal.
2
Ryazan State Radio Engineering University, Gagarin Str. 59/1, 390005, Ryazan, Russian Federation.
3
Key Laboratory of Artificial Micro- and Nano-structures of Ministry of Education and Hubei Key Laboratory of Nuclear Solid Physics, School of Physics and Technology, Wuhan University, 430072, Wuhan, China.
4
Institute for Physics of Microstructures of the Russian Academy of Sciences (IPM RAS), 603950 Nizhniy Novgorod, Russian Federation.
5
Faculty of Physics, Lomonosov Moscow State University, Leninskie Gory, 119991, Moscow, Russian Federation.
6
Raith GmbH, Konrad-Adenauer-Allee 8, 44263, Dortmund, Germany.
PMID:
30408251
DOI:
10.1002/rcm.8345

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