Auger-electron diffraction in the low kinetic-energy range: The Si(111)7 x 7 surface reconstruction and Ge/Si interface formation
Phys Rev B Condens Matter
.
1995 Jul 15;52(3):1806-1815.
doi: 10.1103/physrevb.52.1806.
Authors
De Crescenzi M
,
R Gunnella
,
R Bernardini
,
De Marco M
,
I Davoli I
PMID:
9981248
DOI:
10.1103/physrevb.52.1806
No abstract available