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Sensors (Basel). 2019 Mar 29;19(7). pii: E1530. doi: 10.3390/s19071530.

Photo-Induced Force Microscopy by Using Quartz Tuning-Fork Sensor.

Author information

1
Center for Nanocharacterization, Korea Research Institute of Standards and Science, Daejeon 34113, Korea. phyjjh@kriss.re.kr.
2
Center for Nanocharacterization, Korea Research Institute of Standards and Science, Daejeon 34113, Korea. h.kwon@kriss.re.kr.
3
Center for Nanocharacterization, Korea Research Institute of Standards and Science, Daejeon 34113, Korea. eslee@kriss.re.kr.

Abstract

We present the photo-induced force microscopy (PiFM) studies of various nano-materials by implementing a quartz tuning fork (QTF), a self-sensing sensor that does not require complex optics to detect the motion of a force probe and thus helps to compactly configure the nanoscale optical mapping tool. The bimodal atomic force microscopy technique combined with a sideband coupling scheme is exploited for the high-sensitivity imaging of the QTF-PiFM. We measured the photo-induced force images of nano-clusters of Silicon 2,3-naphthalocyanine bis dye and thin graphene film and found that the QTF-PiFM is capable of high-spatial-resolution nano-optical imaging with a good signal-to-noise ratio. Applying the QTF-PiFM to various experimental conditions will open new opportunities for the spectroscopic visualization and substructure characterization of a vast variety of nano-materials from semiconducting devices to polymer thin films to sensitive measurements of single molecules.

KEYWORDS:

nano-optics; photo-induced force microscopy (PiFM); quartz tuning fork

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