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Adv Sci (Weinh). 2018 Oct 4;5(11):1801350. doi: 10.1002/advs.201801350. eCollection 2018 Nov.

Control of Interface Defects for Efficient and Stable Quasi-2D Perovskite Light-Emitting Diodes Using Nickel Oxide Hole Injection Layer.

Author information

1
School of Materials Science and Engineering and Low Dimensional Carbon Center and KIST-UNIST Ulsan Center for Convergent Materials Ulsan National Institute of Science and Technology (UNIST) UNIST-gil 50 Ulsan 44919 Republic of Korea.
2
Department of Physics and Centre for Plastic Electronics Imperial College London Prince Consort Road London SW7 2AZ UK.
3
Department of Physics Pukyong National University 45 Yongso-ro, Nam-Gu Busan 48513 Republic of Korea.
4
Cavendish Laboratory JJ Thomson Avenue Cambridge CB3 0HE UK.

Abstract

Metal halide perovskites (MHPs) have emerged as promising materials for light-emitting diodes owing to their narrow emission spectrum and wide range of color tunability. However, the low exciton binding energy in MHPs leads to a competition between the trap-mediated nonradiative recombination and the bimolecular radiative recombination. Here, efficient and stable green emissive perovskite light-emitting diodes (PeLEDs) with an external quantum efficiency of 14.6% are demonstrated through compositional, dimensional, and interfacial modulations of MHPs. The interfacial energetics and optoelectronic properties of the perovskite layer grown on a nickel oxide (NiO x ) and poly(3,4-ethylenedioxythiophene):polystyrene sulfonate hole injection interfaces are investigated. The better interface formed between the NiO x /perovskite layers in terms of lower density of traps/defects, as well as more balanced charge carriers in the perovskite layer leading to high recombination yield of carriers are the main reasons for significantly improved device efficiency, photostability of perovskite, and operational stability of PeLEDs.

KEYWORDS:

defects; nickel oxide; perovskite light‐emitting diodes; stability

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