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Phys Rev Lett. 2018 Oct 5;121(14):146101. doi: 10.1103/PhysRevLett.121.146101.

Hollow Electron Ptychographic Diffractive Imaging.

Author information

1
National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, People's Republic of China.
2
Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, United Kingdom.
3
Electron Physical Sciences Imaging Centre, Diamond Lightsource Ltd., Didcot, Oxfordshire OX11 0DE, United Kingdom.
4
JEOL Ltd, 1-2 Musashino, 3-Chome, Akishima, Tokyo 196, Japan.
5
Department of Electrical and Electronic Engineering, Southern University of Science and Technology, Shenzhen 518055, People's Republic of China.
6
Department of Chemical Engineering and Materials Science and Department of Physics and Astronomy, University of California, Irvine, California 92697, USA.

Abstract

We report a method for quantitative phase recovery and simultaneous electron energy loss spectroscopy analysis using ptychographic reconstruction of a data set of "hollow" diffraction patterns. This has the potential for recovering both structural and chemical information at atomic resolution with a new generation of detectors.

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