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Phys Rev Lett. 2018 Oct 5;121(14):146101. doi: 10.1103/PhysRevLett.121.146101.

Hollow Electron Ptychographic Diffractive Imaging.

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National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, People's Republic of China.
Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, United Kingdom.
Electron Physical Sciences Imaging Centre, Diamond Lightsource Ltd., Didcot, Oxfordshire OX11 0DE, United Kingdom.
JEOL Ltd, 1-2 Musashino, 3-Chome, Akishima, Tokyo 196, Japan.
Department of Electrical and Electronic Engineering, Southern University of Science and Technology, Shenzhen 518055, People's Republic of China.
Department of Chemical Engineering and Materials Science and Department of Physics and Astronomy, University of California, Irvine, California 92697, USA.


We report a method for quantitative phase recovery and simultaneous electron energy loss spectroscopy analysis using ptychographic reconstruction of a data set of "hollow" diffraction patterns. This has the potential for recovering both structural and chemical information at atomic resolution with a new generation of detectors.

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