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Nanoscale. 2018 May 3;10(17):7971-7977. doi: 10.1039/C8NR00471D.

Tungsten diselenide for all-fiber lasers with the chemical vapor deposition method.

Author information

1
State Key Laboratory of Information Photonics and Optical Communications, School of Science, P. O. Box 91. and Beijing University of Posts and Telecommunications, Beijing 100876, China. mlei@bupt.edu.cn and Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China. zywei@iphy.ac.cn.
2
State Key Laboratory of Information Photonics and Optical Communications, School of Science, P. O. Box 91. and Beijing University of Posts and Telecommunications, Beijing 100876, China. mlei@bupt.edu.cn.
3
Shenzhen Key Laboratory of Laser Engineering, College of Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, China. yanpg@szu.edu.cn.
4
University Research Facility in Materials Characterization and Device Fabrication, Hong Kong Polytechnic University, Kowloon, Hong Kong.
5
Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China. zywei@iphy.ac.cn.

Abstract

Two-dimensional materials have become the focus of research for their photoelectric properties, and are employed as saturable absorption materials. Currently, the challenge is how to further improve the modulation depth of saturable absorbers (SAs) based on two-dimensional materials. In this paper, three kinds of WSe2 films with different thicknesses are prepared using the chemical vapor deposition method. The nonlinear optical responses of the WSe2 films including the nonlinear saturable absorption and nonlinear refractive index are characterized by the double-balanced detection method and Z-scan experiments. Different modulation depths are successfully obtained by controlling the thickness of the WSe2 films. We further incorporate them into an all-fiber laser to generate mode-locked pulses. The mode-locked fiber lasers with a pulse duration of 185 fs, 205.7 fs and 230.3 fs are demonstrated when the thickness of the WSe2 films is measured to be 1.5 nm, 5.7 nm and 11 nm, respectively. This work provides new prospects for WSe2 in ultrafast photonic device applications.

PMID:
29561925
DOI:
10.1039/C8NR00471D

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