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Sci Rep. 2018 Mar 15;8(1):4585. doi: 10.1038/s41598-018-22966-7.

Extended depth-resolved imaging through a thin scattering medium with PSF manipulation.

Author information

1
Department of Physics, College of Science, Shantou University, Shantou, Guangdong, 515063, China.
2
State Key Laboratory of Optoelectronic Materials and Technologies, Sun Yat-sen University, Guangzhou, 510275, China.
3
School of Physics and Optoelectronic Engineering, Foshan University, Foshan, 528000, China. sysuhhx@163.com.
4
State Key Laboratory of Optoelectronic Materials and Technologies, Sun Yat-sen University, Guangzhou, 510275, China. stszjy@mail.sysu.edu.cn.

Abstract

Human ability to visualize an image is usually hindered by optical scattering. Recent extensive studies have promoted imaging technique through turbid materials to a reality where color image can be restored behind scattering media in real time. The big challenge now is to recover objects in a large field of view with depth resolving ability. Based on the existing research results, we systematically study the physical relationship between speckles generated from objects at different planes. By manipulating a given single point spread function, depth-resolved imaging through a thin scattering medium can be extended beyond the original depth of field (DOF). Experimental testing of standard scattering media shows that the DOF can be extended up to 5 times and the physical mechanism is depicted. This extended DOF is benefit to 3D imaging through scattering environment, and it is expected to have important applications in science, technology, bio-medical, security and defense.

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