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Adv Mater. 2018 Feb;30(8). doi: 10.1002/adma.201704320. Epub 2018 Jan 10.

Nociceptive Memristor.

Author information

1
Department of Materials Science and Engineering, and Inter-University Semiconductor Research Center, College of Engineering, Seoul National University, Seoul, 151-744, Republic of Korea.
2
Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA, 01003, USA.
3
Center for Nanotechnology, NASA Ames Research Center, Moffett Field, CA, 94035, USA.
4
Hewlett Packard Laboratories, Hewlett Packard Enterprise, Palo Alto, CA, 94304, USA.

Abstract

The biomimetic characteristics of the memristor as an electronic synapse and neuron have inspired the advent of new information technology in the neuromorphic computing. The application of the memristors can be extended to the artificial nerves on condition of the presence of electronic receptors which can transfer the external stimuli to the internal nerve system. In this work, nociceptor behaviors are demonstrated from the Pt/HfO2 /TiN memristor for the electronic receptors. The device shows four specific nociceptive behaviors; threshold, relaxation, allodynia, and hyperalgesia, according to the strength, duration, and repetition rate of the external stimuli. Such nociceptive behaviors are attributed to the electron trapping/detrapping to/from the traps in the HfO2 layer, where the depth of trap energy level is ≈0.7 eV. Also, the built-in potential by the work function mismatch between the Pt and TiN electrodes induces time-dependent relaxation of trapped electrons, providing the appropriate relaxation behavior. The relaxation time can take from several milliseconds to tens of seconds, which corresponds to the time span of the decay of biosignal. The material-wise evaluation of the electronic nociceptor in comparison with other material, which did not show the desired functionality, Pt/Ti/HfO2 /TiN, reveals the importance of careful material design and fabrication.

KEYWORDS:

charge trapping; memristors; nociceptors; relaxation; thresholds

PMID:
29318678
DOI:
10.1002/adma.201704320

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