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J Appl Crystallogr. 2017 May 30;50(Pt 3):901-908. doi: 10.1107/S1600576717005581. eCollection 2017 Jun 1.

Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a two-dimensional energy-dispersive detector.

Author information

1
Department of Physics, University of Siegen, Siegen 57072, Germany.
2
Max-Planck-Institut für Eisenforschung GmbH, Düsseldorf 40237, Germany.
3
Montanuniversität Leoben, Leoben 8700, Austria.
4
Fakultät für Ingenieurwissenschaften, Türkish German Universität, Sahinkaya Caddesi 86, Istanbul, 34820, Turkey.
5
CEA-Grenoble/DRFMC/SprAM, 17 rue des Martyrs, Grenoble Cedex 9, F-38054, France.
6
PNSensor GmbH, Otto-Hahn-Ring 6, München 81739, Germany.

Abstract

The full strain and stress tensor determination in a triaxially stressed single crystal using X-ray diffraction requires a series of lattice spacing measurements at different crystal orientations. This can be achieved using a tunable X-ray source. This article reports on a novel experimental procedure for single-shot full strain tensor determination using polychromatic synchrotron radiation with an energy range from 5 to 23 keV. Microbeam X-ray Laue diffraction patterns were collected from a copper micro-bending beam along the central axis (centroid of the cross section). Taking advantage of a two-dimensional energy-dispersive X-ray detector (pnCCD), the position and energy of the collected Laue spots were measured for multiple positions on the sample, allowing the measurement of variations in the local microstructure. At the same time, both the deviatoric and hydrostatic components of the elastic strain and stress tensors were calculated.

KEYWORDS:

energy-dispersive X-ray detectors; microbeam X-ray Laue diffraction; strain

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