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J Colloid Interface Sci. 2017 May 1;493:162-170. doi: 10.1016/j.jcis.2017.01.025. Epub 2017 Jan 10.

Nanostructured tin oxide films: Physical synthesis, characterization, and gas sensing properties.

Author information

1
Functional Materials Research Laboratory, School of Physical Sciences, Solapur University, Solapur 413255, MS, India.
2
College of Materials Science and Engineering, Shenzhen Key Laboratory of Polymer Science and Technology, Shenzhen University, Shenzhen 518060, PR China.
3
School of Physical Sciences, SRTM University, Nanded, MS, India.
4
Technical Physics Division, Bhabha Atomic Research Centre, Trombay, Mumbai, India.
5
National Physical Laboratory, New Delhi, India.
6
Functional Materials Research Laboratory, School of Physical Sciences, Solapur University, Solapur 413255, MS, India. Electronic address: drvbpatil@gmail.com.

Abstract

Nanostructured tin oxide (SnO2) films are synthesized using physical method i.e. thermal evaporation and are further characterized with X-ray diffraction, X-ray photoelectron spectroscopy, scanning electron microscopy, transmission electron microscopy, and atomic force microscopy measurement techniques for confirming its structure and morphology. The chemiresistive properties of SnO2 films are studied towards different oxidizing and reducing gases where these films have demonstrated considerable selectivity towards oxidizing nitrogen dioxide (NO2) gas with a maximum response of 403% to 100ppm @200°C, and fast response and recovery times of 4s and 210s, respectively, than other test gases. In addition, SnO2 films are enabling to detect as low as 1ppm NO2 gas concentration @200°C with 23% response enhancement. Chemiresistive performances of SnO2 films are carried out in the range of 1-100ppm and reported. Finally, plausible adsorption and desorption reaction mechanism of NO2 gas molecules with SnO2 film surface has been thoroughly discussed by means of an impedance spectroscopy analysis.

KEYWORDS:

Impedance spectroscopy; NO(2) sensor; Structure and morphology; Thermal evaporation; Tin oxide

PMID:
28088568
DOI:
10.1016/j.jcis.2017.01.025

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