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Nano Lett. 2016 Dec 14;16(12):7650-7654. Epub 2016 Dec 2.

Epitaxial Growth of MgxCa1-xO on GaN by Atomic Layer Deposition.

Author information

1
Department of Chemistry and Chemical Biology, Harvard University , Cambridge, Massachusetts 02138, United States.
2
School of Electrical and Computer Engineering and Birck Nanotechnology Center, Purdue University , West Lafayette, Indiana 47906, United States.

Abstract

We demonstrate for the first time that a single-crystalline epitaxial MgxCa1-xO film can be deposited on gallium nitride (GaN) by atomic layer deposition (ALD). By adjusting the ratio between the amounts of Mg and Ca in the film, a lattice matched MgxCa1-xO/GaN(0001) interface can be achieved with low interfacial defect density. High-resolution X-ray diffraction (XRD) shows that the lattice parameter of this ternary oxide nearly obeys Vegard's law. An atomically sharp interface from cross-sectional transmission electron microscopy (TEM) confirmed the high quality of the epitaxy. High-temperature capacitance-voltage characterization showed that the film with composition Mg0.25Ca0.75O has the lowest interfacial defect density. With this optimal oxide composition, a Mg0.25Ca0.75O/AlGaN/GaN metal-oxide-semiconductor high-electron-mobility (MOS-HEMT) device was fabricated. An ultrahigh on/off ratio of 1012 and a near ideal SS of 62 mV/dec were achieved with this device.

KEYWORDS:

Epitaxy; GaN; MOS-HEMT; dielectric; magnesium calcium oxide

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