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Opt Lett. 2016 Sep 15;41(18):4190-3. doi: 10.1364/OL.41.004190.

Electro-optic dual-comb interferometry over 40  nm bandwidth.

Abstract

Dual-comb interferometry is a measurement technique that uses two laser frequency combs to retrieve complex spectra in a line-by-line basis. This technique can be implemented with electro-optic frequency combs, offering intrinsic mutual coherence, high acquisition speed and flexible repetition-rate operation. A challenge with the operation of this kind of frequency comb in dual-comb interferometry is its limited optical bandwidth. Here, we use coherent spectral broadening and demonstrate electro-optic dual-comb interferometry over the entire telecommunications C band (200 lines covering ∼40  nm, measured within 10 μs at 100 signal-to-noise ratio per spectral line). These results offer new prospects for electro-optic dual-comb interferometry as a suitable technology for high-speed broadband metrology, for example in optical coherence tomography or coherent Raman microscopy.

PMID:
27628354
DOI:
10.1364/OL.41.004190

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