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Appl Opt. 2016 Sep 1;55(25):6832-5. doi: 10.1364/AO.55.006832.

Figure of merit enhancement of surface plasmon resonance sensors using absentee layer.


By adding an absentee layer on the top of the metallic layer, the figure of merit (FOM) of a surface plasmon resonance (SPR) sensor with Kretschmann configuration was enhanced, without changing the resonance angle and the reflectance at the resonance angle. Comparing with a traditional SPR sensor, the FOM of the SPR sensor with an absentee layer composed of either 1367 nm thick KCl or 235 nm thick Si<sub>3</sub>N<sub>4</sub> can be improved by 5.53% or 11.41%, respectively. The enhancement of the FOM should be attributed to the faster decrease of the full width at half-maximum than the sensitivity after an absentee layer was applied in the SPR sensor.


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