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Appl Opt. 2016 Sep 1;55(25):6832-5. doi: 10.1364/AO.55.006832.

Figure of merit enhancement of surface plasmon resonance sensors using absentee layer.

Abstract

By adding an absentee layer on the top of the metallic layer, the figure of merit (FOM) of a surface plasmon resonance (SPR) sensor with Kretschmann configuration was enhanced, without changing the resonance angle and the reflectance at the resonance angle. Comparing with a traditional SPR sensor, the FOM of the SPR sensor with an absentee layer composed of either 1367 nm thick KCl or 235 nm thick Si<sub>3</sub>N<sub>4</sub> can be improved by 5.53% or 11.41%, respectively. The enhancement of the FOM should be attributed to the faster decrease of the full width at half-maximum than the sensitivity after an absentee layer was applied in the SPR sensor.

PMID:
27607256
DOI:
10.1364/AO.55.006832

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