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Nanotechnology. 2016 Sep 9;27(36):364001. doi: 10.1088/0957-4484/27/36/364001. Epub 2016 Aug 1.

Non-rigid registration and non-local principle component analysis to improve electron microscopy spectrum images.

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1
Department of Materials Science and Engineering, The University of Wisconsin-Madison, 1509 University Avenue, Madison, WI 53706, USA.

Abstract

Image registration and non-local Poisson principal component analysis (PCA) denoising improve the quality of characteristic x-ray (EDS) spectrum imaging of Ca-stabilized Nd2/3TiO3 acquired at atomic resolution in a scanning transmission electron microscope. Image registration based on the simultaneously acquired high angle annular dark field image significantly outperforms acquisition with a long pixel dwell time or drift correction using a reference image. Non-local Poisson PCA denoising reduces noise more strongly than conventional weighted PCA while preserving atomic structure more faithfully. The reliability of and optimal internal parameters for non-local Poisson PCA denoising of EDS spectrum images is assessed using tests on phantom data.

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