Depth measurement using structured light and spatial frequency

Appl Opt. 2016 Jul 1;55(19):5069-75. doi: 10.1364/AO.55.005069.

Abstract

This paper proposes a novel design of an optical system for depth measurement, adopting a computer-generated hologram to project a periodic line pattern from which a coaxial triangulation is performed. The spatial periodicity of diffraction images captured in the system is converted to the frequency domain, and the relative depth of the plane of interest is acquired. The experimental results show that the system could achieve resolution in the range of 1 mm over a relative depth range of ∼300-600 mm from the camera. The standard deviations are 0.71 and 0.46 mm for two experiments.