Improvements of the standardization of (134)Cs by the critical window setting for 605keV photopeak

Akira Yunoki; Yasushi Kawada; Yoshio Hino

doi:10.1016/j.apradiso.2015.12.011

Improvements of the standardization of (134)Cs by the critical window setting for 605keV photopeak

Appl Radiat Isot. 2016 Mar:109:374-377. doi: 10.1016/j.apradiso.2015.12.011. Epub 2015 Dec 5.

Authors

Akira Yunoki¹, Yasushi Kawada², Yoshio Hino²

Affiliations

¹ National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba Central 2, 1-1-1, Umezono, Tsukuba, Ibaraki 305-8568, Japan. Electronic address: a.yunoki@aist.go.jp.
² National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba Central 2, 1-1-1, Umezono, Tsukuba, Ibaraki 305-8568, Japan.

PMID: 26702547
DOI: 10.1016/j.apradiso.2015.12.011

Abstract

In the standardization of (134)Cs by the 4πβ-γ coincidence method with a γ-window at 605keV, the satellite components of 563keV and 569keV overlapping the 605keV peak cause a steep slope and non-linearity of the efficiency extrapolation function. By shifting the lower threshold of a γ-window higher, the satellite components are eliminated, and the slope tends to horizontal. Nearly flat efficiency curves were obtained by using a CeBr3 scintillator for detecting γ-photons, as well as a NaI(Tl) scintillator.

Keywords: (134)Cs; 605keV peak window; Horizontal efficiency functions; Rejection of 593keV and 569keV satellite components; Shifting lower level of the window.