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J Synchrotron Radiat. 2015 Sep;22(5):1147-50. doi: 10.1107/S1600577515012345. Epub 2015 Jul 15.

Optimal azimuthal orientation for Si(111) double-crystal monochromators to achieve the least amount of glitches in the hard X-ray region.

Author information

1
Beijing Synchrotron Radiation Facility, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, People's Republic of China.

Abstract

Simulations of the periods, split regularities and mirror symmetries of the glitch pattern of a Si(111) crystal along with the azimuthal angles are presented. The glitch patterns of Si(111) double-crystal monochromators (DCMs) are found to be the superposition of the two sets of glitch patterns from the two crystals. The optimal azimuthal orientation ϕ1,2 = [(2n+1)π]/6 (n = 0, ±1, ±2…) for Si(111) DCMs to achieve the least amount of glitches in the hard X-ray region has been suggested.

KEYWORDS:

XAFS; double-crystal monochromator; glitches; multiple-beam diffraction; optimal azimuthal orientation

PMID:
26289264
DOI:
10.1107/S1600577515012345

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