Format

Send to

Choose Destination
J Mater Chem B. 2015 Jul 7;3(25):4965-4978.

Photoelectric artefact from optogenetics and imaging on microelectrodes and bioelectronics: New Challenges and Opportunities.

Author information

1
Department of Bioengineering, University of Pittsburgh, Pittsburgh, PA 15260, USA. ; McGowan Institute of Regenerative Medicine, University of Pittsburgh, Pittsburgh, PA 15260, USA. ; Center for the Neural Basis of Cognition, University of Pittsburgh, Pittsburgh, PA 15260, USA.
2
Department of Bioengineering, University of Pittsburgh, Pittsburgh, PA 15260, USA. ; McGowan Institute of Regenerative Medicine, University of Pittsburgh, Pittsburgh, PA 15260, USA. ; Center for the Neural Basis of Cognition, University of Pittsburgh, Pittsburgh, PA 15260, USA. ; Department of Radiology, University of Pittsburgh, Pittsburgh, PA 15260, USA.

Abstract

Bioelectronics, electronic technologies that interface with biological systems, are experiencing rapid growth in terms of technology development and applications, especially in neuroscience and neuroprosthetic research. The parallel growth with optogenetics and in vivo multi-photon microscopy has also begun to generate great enthusiasm for simultaneous applications with bioelectronic technologies. However, emerging research showing artefact contaminated data highlight the need for understanding the fundamental physical principles that critically impact experimental results and complicate their interpretation. This review covers four major topics: 1) material dependent properties of the photoelectric effect (conductor, semiconductor, organic, photoelectric work function (band gap)); 2) optic dependent properties of the photoelectric effect (single photon, multiphoton, entangled biphoton, intensity, wavelength, coherence); 3) strategies and limitations for avoiding/minimizing photoelectric effects; and 4) advantages of and applications for light-based bioelectronics (photo-bioelectronics).

Supplemental Content

Full text links

Icon for PubMed Central
Loading ...
Support Center