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Opt Lett. 2014 Aug 15;39(16):4747-50. doi: 10.1364/OL.39.004747.

Electron beam position monitor for a dielectric microaccelerator.

Abstract

We report the fabrication and first demonstration of an electron beam position monitor for a dielectric microaccelerator. This device is fabricated on a fused silica substrate using standard optical lithography techniques and uses the radiated optical wavelength to measure the electron beam position with a resolution of 10 μm, or 7% of the electron beam spot size. This device also measures the electron beam spot size in one dimension.

PMID:
25121864

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