Format

Send to

Choose Destination
See comment in PubMed Commons below
Rev Sci Instrum. 2014 May;85(5):053104. doi: 10.1063/1.4874575.

Measurement of modal birefringence in optical waveguides based on the Mach-Zehnder interferometer.

Author information

1
Laboratory of Nanophotonic Functional Materials and Devices, School for Information and Optoelectronic Science and Engineering, South China Normal University, Guangzhou 510006, China.
2
Sunblence Technologies Co., LTD, Foshan 528251, China.

Abstract

A method for measuring the birefringence in planar waveguide circuits is theoretically proposed and validated. The method is based on the Mach-Zehnder interference and by measuring the spectral shift due to orthogonal polarization states. The birefringence of a silica waveguide is measured to be 2.33 × 10(-4) at nearby 1550 nm. In addition, the birefringence variations with the wavelength and its dependence on the external stress are investigated with the proposed method experimentally. The results in measuring birefringence demonstrate a high accuracy with the order of 10(-5), a wide dynamic range from 10(-5) to 10(-3), and a characteristic of multi-wavelength evaluation.

PMID:
24880350
DOI:
10.1063/1.4874575
PubMed Commons home

PubMed Commons

0 comments
How to join PubMed Commons

    Supplemental Content

    Full text links

    Icon for American Institute of Physics
    Loading ...
    Support Center