Send to

Choose Destination
Rev Sci Instrum. 2014 Mar;85(3):033702. doi: 10.1063/1.4866656.

Nanopipette combined with quartz tuning fork-atomic force microscope for force spectroscopy/microscopy and liquid delivery-based nanofabrication.

Author information

Department of Physics and Astronomy, Center for Nano-Liquid, Seoul National University, Seoul 151-747, South Korea.


This paper introduces a nanopipette combined with a quartz tuning fork-atomic force microscope system (nanopipette/QTF-AFM), and describes experimental and theoretical investigations of the nanoscale materials used. The system offers several advantages over conventional cantilever-based AFM and QTF-AFM systems, including simple control of the quality factor based on the contact position of the QTF, easy variation of the effective tip diameter, electrical detection, on-demand delivery and patterning of various solutions, and in situ surface characterization after patterning. This tool enables nanoscale liquid delivery and nanofabrication processes without damaging the apex of the tip in various environments, and also offers force spectroscopy and microscopy capabilities.

[Indexed for MEDLINE]

Supplemental Content

Full text links

Icon for American Institute of Physics
Loading ...
Support Center