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J Synchrotron Radiat. 2014 Jan;21(Pt 1):16-23. doi: 10.1107/S1600577513024077. Epub 2013 Nov 2.

Tests and characterization of a laterally graded multilayer Montel mirror.

Author information

1
Diamond Light Source Ltd, Harwell Science and Innovation Campus, Didcot OX11 0DE, UK.
2
Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, USA.

Abstract

Multilayers are becoming an increasingly important tool in X-ray optics. The essential parameters to design a pair of laterally graded multilayer mirrors arranged in a Montel-type configuration for use as an X-ray collimating device are provided. The results of X-ray reflectometry tests carried out on the optics in addition to metrology characterization are also shown. Finally, using experimental data and combined with X-ray tracing simulations it is demonstrated that the mirror meets all stringent specifications as required for a novel ultra-high-resolution inelastic X-ray scattering spectrometer at the Advanced Photon Source.

KEYWORDS:

KB mirrors; Montel mirrors; X-ray optics; collimating optics; laterally graded multilayers

PMID:
24365912
DOI:
10.1107/S1600577513024077
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