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Nanotechnology. 2013 Apr 12;24(14):145401. doi: 10.1088/0957-4484/24/14/145401. Epub 2013 Mar 12.

Variable temperature electrochemical strain microscopy of Sm-doped ceria.

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The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.

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  • Nanotechnology. 2014 Feb 28;25(8):089501.


Variable temperature electrochemical strain microscopy has been used to study the electrochemical activity of Sm-doped ceria as a function of temperature and bias. The electrochemical strain microscopy hysteresis loops have been collected across the surface at different temperatures and the relative activity at different temperatures has been compared. The relaxation behavior of the signal at different temperatures has been also evaluated to relate kinetic process during bias induced electrochemical reactions with temperature and two different kinetic regimes have been identified. The strongly non-monotonic dependence of relaxation behavior on temperature is interpreted as evidence for water-mediated mechanisms.

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