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Opt Express. 2012 Oct 22;20(22):24167-74. doi: 10.1364/OE.20.024167.

Line scan--structured illumination microscopy super-resolution imaging in thick fluorescent samples.

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1
Institute for Adaptive and Neural Computation, University of Edinburgh, Edinburgh, UK.

Abstract

Structured illumination microscopy in thick fluorescent samples is a challenging task. The out-of-focus fluorescence background deteriorates the illumination pattern and the reconstructed images suffer from influence of noise. We present a combination of structured illumination microscopy with line scanning. This technique reduces the out-of-focus fluorescence background, which improves the modulation and the quality of the illumination pattern and therefore facilitates the reconstruction. We present super-resolution, optically sectioned images of a thick fluorescent sample, revealing details of the specimen's inner structure.

PMID:
23187180
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