Format

Send to

Choose Destination
Rev Sci Instrum. 2012 Oct;83(10):103105. doi: 10.1063/1.4756691.

A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies.

Author information

1
Paul Scherrer Institut, 5232 Villigen PSI, Switzerland. jakub.szlachetko@psi.ch

Abstract

We report on the design and performance of a wavelength-dispersive type spectrometer based on the von Hamos geometry. The spectrometer is equipped with a segmented-type crystal for x-ray diffraction and provides an energy resolution in the order of 0.25 eV and 1 eV over an energy range of 8000 eV-9600 eV. The use of a segmented crystal results in a simple and straightforward crystal preparation that allows to preserve the spectrometer resolution and spectrometer efficiency. Application of the spectrometer for time-resolved resonant inelastic x-ray scattering and single-shot x-ray emission spectroscopy is demonstrated.

PMID:
23126749
DOI:
10.1063/1.4756691

Supplemental Content

Full text links

Icon for American Institute of Physics
Loading ...
Support Center