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Opt Lett. 2012 Oct 1;37(19):4089-91. doi: 10.1364/OL.37.004089.

Reflective interferometry for optical metamaterial phase measurements.

Author information

1
NSF Nano-scale Science and Engineering Center (NSEC), 3112 Etcheverry Hall, University of California, Berkeley, California 94720, USA.

Abstract

The unambiguous determination of optical refractive indices of metamaterials is a challenging task for device applications and the study of new optical phenomena. We demonstrate here simple broadband phase measurements of metamaterials using spectrally and spatially resolved interferometry. We study the phase response of a π-shaped metamaterial known to be an analog to electromagnetically induced transparency. The measured broadband interferograms give the phase delay or advance produced by the metamaterial in a single measurement. The presented technique offers an effective way of characterizing optical metamaterials including nonlinear and gain-metamaterial systems.

PMID:
23027288
DOI:
10.1364/OL.37.004089

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