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J Nanosci Nanotechnol. 2011 Dec;11(12):10725-8.

Near field imaging from multilayer lens.

Author information

1
Department of Physics, Hong Kong Baptist University, 224 Waterloo Road, Kowloon Tong, Hong Kong, China.

Abstract

Multilayer superlens has been reported that it had advantages over the single metal layer superlens. In this work, single silver layer and Ag-SiO2 multilayer superlens devices working at wavelength of 365 nm were fabricated using standard photolithography method. Grating objects with line/space (190 nm/190 nm) resolution could be resolved through both kinds of lens structures with working distance up to 128 nm. However, Ag-SiO2 multilayer lens shows higher transmittance and image contrast than the single silver layer device, the experimental result proves the theoretical calculation.

PMID:
22408982

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