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Phys Rev Lett. 2012 Jan 27;108(4):047601. Epub 2012 Jan 24.

Atomic structure of highly strained BiFeO3 thin films.

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  • 1Electron Microscopy Center, Empa, Swiss Federal Laboratories for Materials Science and Technology, CH-8600 Dübendorf, Switzerland. marta.rossell@empa.ch

Abstract

We determine the atomic structure of the pseudotetragonal T phase and the pseudorhombohedral R phase in highly strained multiferroic BiFeO(3) thin films by using a combination of atomic-resolution scanning transmission electron microscopy and electron energy-loss spectroscopy. The coordination of the Fe atoms and their displacement relative to the O and Bi positions are assessed by direct imaging. These observations allow us to interpret the electronic structure data derived from electron energy-loss spectroscopy and provide evidence for the giant spontaneous polarization in strained BiFeO(3) thin films.

PMID:
22400888
DOI:
10.1103/PhysRevLett.108.047601
[PubMed]
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