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J Nanosci Nanotechnol. 2011 Aug;11(8):7339-42.

Electrical characterization of n/p-type nickel silicide/silicon junctions by Sb segregation.

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Power Control Device Team, Electronics and Telecommunications Research Institute (ETRI), Daejeon 305-700, Korea.


In this paper, n/p-type nickel-silicided Schottky diodes were fabricated by incorporating antimony atoms near the nickel silicide/Si junction interface and the electrical characteristics were studied through measurements and simulations. The effective Schottky barrier height (SBH) for electron, extracted from the thermionic emission model, drastically decreased from 0.68 to less than 0.1 eV while that for hole slightly increased from 0.43 to 0.53 eV. In order to identify the current conduction mechanisms, the experimental current-temperature-voltage characteristics for the n-type diode were fitted based on various models for transport of charge carrier in Schottky diodes. As the result, the large change in effective SBH for electron is ascribed to trap-assisted tunneling rather than barrier height inhomogeneity.

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