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J Phys Chem B. 2011 Dec 15;115(49):14493-500. doi: 10.1021/jp207387d. Epub 2011 Nov 11.

Dielectric fluctuations over polymer films detected using an atomic force microscope.

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1
Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, New York 14853, United States.

Abstract

We present a systematic study of the frequency noise experienced by a charged atomic force microscope cantilever due to thermal dielectric fluctuations in a thin-film sample of poly(vinyl acetate). Here, the tip of the commercial atomic force microscope cantilever oscillates in the conventional direction, normal to the surface of the film, complementing our previous studies of dielectric fluctuations carried out using an ultrasensitive custom-fabricated cantilever oscillating parallel to the film surface. We show that frequency noise induced by mechanical vibrations can be distinguished from frequency noise resulting from thermal dielectric fluctuations by the dependence on applied voltage and tip-sample separation, allowing molecular information to be unambiguously extracted. A linear response theory for cantilever frequency noise over a molecular material correctly reproduces the observed dependences on frequency, voltage, and tip-sample separation. The technique is shown to measure primarily fluctuations in the electric field gradient over the surface, which in these measurements are generated by orientational relaxation of polar polymer segments.

PMID:
21999599
DOI:
10.1021/jp207387d

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