Format

Send to

Choose Destination
Rev Sci Instrum. 2011 Jul;82(7):074903. doi: 10.1063/1.3606441.

Thermal conductivity measurements using 1ω and 3ω methods revisited for voltage-driven setups.

Author information

1
Institute of Applied Physics, University of Hamburg, Jungiusstrasse 11, 20355 Hamburg, Germany.

Abstract

1ω and 3ω methods are widely established transient measurement techniques for the characterization of thermal transport in bulk-materials, thin films, and 1D nano-objects. These methods are based on resistance oscillations of a heater caused by Joule-heating from a sinusoidal current at frequency 1ω which lead to changes in the 1ω voltage and produce a voltage component at 3ω. Although the usual formalism for analyzing the measurement data assumes an ideal current source, voltage-driven measurement setups are employed in many cases. In this context, we find that there has been lack of clarity if a correction generally has to be considered when analyzing the measurement data from voltage driven setups. In this work, Fourier-analysis is employed to show that a correction is not required for 1ω methods and for 3ω measurements that use common-mode-subtraction. Experimental results are presented for a line heater on a fused silica substrate with known thermal properties, and for an individual nickel wire with diameter of 150 nm.

PMID:
21806217
DOI:
10.1063/1.3606441

Supplemental Content

Full text links

Icon for American Institute of Physics
Loading ...
Support Center