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Bernoulli (Andover). 2011 Feb;17(1):347-394.

Simultaneous Critical Values For T-Tests In Very High Dimensions.

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Department of Statistics and Operations Research, 318 Hanes Hall, CB 3260, University of North Carolina at Chapel Hill, Chapel Hill, NC, 27599.


This article considers the problem of multiple hypothesis testing using t-tests. The observed data are assumed to be independently generated conditional on an underlying and unknown two-state hidden model. We propose an asymptotically valid data-driven procedure to find critical values for rejection regions controlling k-family wise error rate (k-FWER), false discovery rate (FDR) and the tail probability of false discovery proportion (FDTP) by using one-sample and two-sample t-statistics. We only require finite fourth moment plus some very general conditions on the mean and variance of the population by virtue of the moderate deviations properties of t-statistics. A new consistent estimator for the proportion of alternative hypotheses is developed. Simulation studies support our theoretical results and demonstrate that the power of a multiple testing procedure can be substantially improved by using critical values directly as opposed to the conventional p-value approach. Our method is applied in an analysis of the microarray data from a leukemia cancer study that involves testing a large number of hypotheses simultaneously.

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