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Appl Opt. 1996 Nov 1;35(31):6151-61. doi: 10.1364/AO.35.006151.

Wave-front analysis with high accuracy by use of a double-grating lateral shearing interferometer.


A phase-stepped double-grating lateral shearing interferometer to be used for wave-front analysis is presented. The resulting interference patterns are analyzed with a differential Zernike polynomial matrix-inversion method. Possible error sources are analyzed in the design stage, and it is shown that the inaccuracy can be kept within 2-5 mλ rms. The apparatus was tested and evaluated in practice. Comparison with a phase-stepped Twyman-Green interferometer demonstrates that the accuracy of the two methods is comparable. Lateral shearing interferometry scores better on reproducibility, owing to the stability and robustness of the method.

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