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J Am Chem Soc. 2010 Oct 13;132(40):14130-6. doi: 10.1021/ja104567f.

Local current mapping and patterning of reduced graphene oxide.

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Nanochemistry Laboratory, ISIS-CNRS 7006, Université de Strasbourg, 8 allée Gaspard Monge, 67000 Strasbourg, France.


Conductive atomic force microscopy (C-AFM) has been used to correlate the detailed structural and electrical characteristics of graphene derived from graphene oxide. Uniform large currents were measured over areas exceeding tens of micrometers in few-layer films, supporting the use of graphene as a transparent electrode material. Moreover, defects such as electrical discontinuities were easily detected. Multilayer films were found to have a higher conductivity per layer than single layers. It is also shown that a local AFM-tip-induced electrochemical reduction process can be used to pattern conductive pathways on otherwise-insulating graphene oxide. Transistors with micrometer-scale tip-reduced graphene channels that featured ambipolar transport and an 8 order of magnitude increase in current density upon reduction were successfully fabricated.

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