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Appl Opt. 1992 Nov 1;31(31):6676-83. doi: 10.1364/AO.31.006676.

Mueller matrix dual-rotating retarder polarimeter.


A computer-controlled Mueller matrix polarimeter with dual rotating retarders is described. Bulk properties of optical materials are determined by controlling the input-polarization state and measuring the output-polarization state. The Mueller matrix of a sample is obtained from polarimetric measurements, and polarization properties, i.e., diattenuation and retardance as well as depolarization, are extracted from the Mueller matrix. Further, fundamental electro- and magneto-optical material properties such as the electro-optical tensor coefficients may be obtained from Mueller matrices measured with applied fields. The polarimeter is currently configured to operate over the 3- to 12-microm spectral region.

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