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Appl Opt. 1990 Jun 20;29(18):2718-21. doi: 10.1364/AO.29.002718.

Optical characterization of grating surface emitting semiconductor lasers.

Abstract

We describe an apparatus for measuring the optical characteristics of grating coupled surface emitting semiconductor lasers. These measurements include far and near field measurements, spectrum, and total power. The far field can be determined with an absolute accuracy of 0.01 degrees .

PMID:
20567320
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