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Appl Opt. 2010 Jun 1;49(16):D96-105. doi: 10.1364/AO.49.000D96.

Generalized model for incoherent detection in confocal optical microscopy.

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Laboratoire Matériaux Optiques, Photonique et Systèmes, EA 4423, Université Paul Verlaine et Supélec (Metz), 2 rue Edouard Belin, 57070 Metz, France.


We develop a generalized model in order to calculate the point spread functions in both the focal and the detection planes for the electric field strengths. In these calculations, based on the generalized Jones matrices, we introduce all of the interdependent parameters that could influence the spatial resolution of a confocal optical microscope. Our proposed model is more nearly complete, since we make no approximations of the scattered electric fields. These results can be successfully applied to standard confocal optical techniques to get a better understanding for more quantitative interpretations of the probe.


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