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Rev Sci Instrum. 2010 Mar;81(3):033706. doi: 10.1063/1.3360826.

A sensitive near-field microscope for thermal radiation.

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1
Department of Basic Science, The University of Tokyo, Komaba 3-8-1, Meguro-ku, Tokyo 153-8902, Japan.

Abstract

A scattering-type scanning near-field optical microscope in long-wavelength infrared (LWIR) region is developed by using an extremely sensitive detector, called the charge-sensitive infrared phototransistor. A tungsten probe attached to a quartz tuning fork is controlled in shear-force mode. Evanescent wave at a sample surface is periodically scattered by slowly (2 Hz) modulating the probe in the direction normal to the sample surface. Near-field microscopy of thermal LWIR radiation from room-temperature Au/GaAs gratings is demonstrated without using any external illumination or excitation. Achieved spatial resolution is better than 300 nm.

PMID:
20370184
DOI:
10.1063/1.3360826
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