Send to

Choose Destination
Nanotechnology. 2010 Apr 30;21(17):175501. doi: 10.1088/0957-4484/21/17/175501. Epub 2010 Apr 6.

Calibration of optically trapped nanotools.

Author information

H H Wills Physics Laboratory, University of Bristol, Bristol, UK.


Holographically trapped nanotools can be used in a novel form of force microscopy. By measuring the displacement of the tool in the optical traps, the contact force experienced by the probe can be inferred. In the following paper we experimentally demonstrate the calibration of such a device and show that its behaviour is independent of small changes in the relative position of the optical traps. Furthermore, we explore more general aspects of the thermal motion of the tool.

Supplemental Content

Full text links

Icon for IOP Publishing Ltd.
Loading ...
Support Center