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J Acoust Soc Am. 2009 Dec;126(6):3188-98. doi: 10.1121/1.3243307.

The role of across-frequency processes in dichotic listening conditions.

Author information

1
International Graduate School Neurosensory Science and Systems, Carl-von-Ossietzky-Universitat Oldenburg, 26111 Oldenburg, Germany. marc.nitschmann@uni-oldenburg.de

Abstract

In the bandwidening experiment with a diotic noise masker, an apparently wider critical bandwidth has often been reported when a dichotic signal (Spi) is used instead of a diotic signal (So). Two competing across-channel processes were proposed to account for this apparently wider critical bandwidth: (i) A detrimental across-channel effect reducing the binaural masking-level difference (BMLD) for broadband maskers and (ii) a beneficial integration of information across channels for narrowband maskers. The two hypotheses result in different predictions of the BMLD in the notched-noise experiment: According to the first hypothesis, the change in BMLD with notch width is determined by the level-dependence of the BMLD for a narrowband masker centered at the signal frequency, whereas the second hypothesis predicts that it is determined by the level-dependence of the BMLD for a broadband masker. To test the hypotheses, masked thresholds of a diotic or dichotic 500-Hz signal were measured for a diotic notched-noise masker as a function of notch width. In addition, thresholds were measured for a diotic broadband and narrowband masker as a function of masker level. The data indicate that neither of the two hypotheses is able to predict the continuous decrease in the BMLD as the notch width increases.

PMID:
20000932
DOI:
10.1121/1.3243307
[Indexed for MEDLINE]

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