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Microsc Microanal. 2004 Dec;10(6):685-90.

Static and dynamic charges: changing perspectives and aims in electron microscopy.

Author information

1
Cavendish Laboratory, University of Cambridge, Madingley Road, Cambridge CB3 0HE, UK. ah30@aphys.cam.ac.uk

Abstract

In the context of electron microscopists' changing attitudes to charging effects, some basic aspects of these phenomenona are surveyed. Methods of mapping internal charge distributions such as doping levels in semiconductors, trap distributions, or internal electric fields in insulators are discussed.

PMID:
19780308
[Indexed for MEDLINE]

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