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Opt Lett. 2009 May 1;34(9):1375-7.

Measurement and simulation of exciton decay times in organic light-emitting devices with different layer structures.

Author information

1
Department of Electronics and Information Systems, Ghent University, Sint-Pietersnieuwstraat 41, B-9000 Gent, Belgium. Saso.Mladenovski@elis.ugent.be

Abstract

The decay time of an exciton depends on the coupling between the dipole oscillator and the optical environment in which it is placed. For an organic light-emitting device this environment is determined by the thin-film layer structure. The radiative decay competes with nonradiative decay channels and in this way influences the luminescent efficiency and the external quantum efficiency of the device. We describe a method to estimate the dependency of the exciton decay time and the luminescent efficiency on the thin-film stack and validate the results experimentally.

PMID:
19412277

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